SI Design Kit (AT-SI)

Over 25 types of SI applications are consolidated in one place. Input DC to correct passivity, reciprocity, and causality errors in Touchstone files. Convert S-parameters to TDR/TDT waveforms. Plot eye diagrams. Convert S-parameters to tabular RLGC models. Convert S-parameters to equivalent SPICE models. Combine multiple .snp files. Includes IEEE 802.3 Channel Operating Margin (COM), Delta-L calculation using curve fitting equations, material property extraction (or MPX for extracting DK, DF, and roughness), IEEE and OIF compliant testing, ccICN calculation, 2D field solver, S-parameter viewer, batch mode, and more.